| General parameterized thermal modeling for high-performance microprocessor design TJ Eguia, SXD Tan, R Shen, D Li, EH Pacheco, M Tirumala, L Wang IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (2), 211-224, 2011 | 28 | 2011 |
| Statistical Modeling and Analysis of Chip-Level Leakage Power by Spectral Stochastic Method R Shen, N Mi, SXD Tan, Y Cai, X Hong Proceedings of 14th Asia and South Pacific Design Automation Conference …, 2009 | 28 | 2009 |
| Statistical performance analysis and modeling techniques for nanometer VLSI designs R Shen, SXD Tan, H Yu Springer Science & Business Media, 2012 | 24 | 2012 |
| Performance bound analysis of analog circuits considering process variations Z Hao, SXD Tan, R Shen, G Shi Proceedings of the 48th Design Automation Conference, 310-315, 2011 | 23 | 2011 |
| Variational capacitance extraction and modeling based on orthogonal polynomial method R Shen, SXD Tan, J Cui, W Yu, Y Cai, GS Chen IEEE transactions on very large scale integration (VLSI) systems 18 (11 …, 2009 | 23 | 2009 |
| General behavioral thermal modeling and characterization for multi-core microprocessor design TJA Eguia, SXD Tan, R Shen, EH Pacheco, M Tirumala 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010 | 19 | 2010 |
| A linear algorithm for full-chip statistical leakage power analysis considering weak spatial correlation R Shen, SXD Tan, J Xiong Proceedings of the 47th Design Automation Conference, 481-486, 2010 | 18 | 2010 |
| Decentralized and passive model order reduction of linear networks with massive ports B Yan, SXD Tan, L Zhou, J Chen, R Shen IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (5), 865-877, 2011 | 17 | 2011 |
| Variational capacitance modeling using orthogonal polynomial method J Cui, G Chen, R Shen, S Tan, W Yu, J Tong Proceedings of the 18th ACM Great Lakes symposium on VLSI, 23-28, 2008 | 17 | 2008 |
| A new voltage binning technique for yield improvement based on graph theory R Shen, SXD Tan, XX Liu Thirteenth International Symposium on Quality Electronic Design (ISQED), 243-248, 2012 | 11 | 2012 |
| Fast statistical full-chip leakage analysis for nanometer VLSI systems R Shen, SXD Tan, H Wang, J Xiong ACM Transactions on Design Automation of Electronic Systems (TODAES) 17 (4 …, 2012 | 8 | 2012 |
| Statistical full-chip dynamic power estimation considering spatial correlations Z Hao, R Shen, SXD Tan, B Liu, G Shi, Y Cai 2011 12th International Symposium on Quality Electronic Design, 1-6, 2011 | 7 | 2011 |
| A linear statistical analysis for full-chip leakage power with spatial correlation R Shen, SXD Tan, J Xiong Proceedings of the 20th symposium on Great lakes symposium on VLSI, 227-232, 2010 | 2 | 2010 |
| A Fast Nonlinear Timing Analysis Method for Nanometer Technologies R Shen, X He 2007 International Conference on Communications, Circuits and Systems, 1150-1153, 2007 | 2 | 2007 |
| Extraction of feedback information from circuit netlists R Shen, X He, L Yang 6th International Conference On ASIC, (ASICON'05) 2005. 2, 895-899, 2005 | 1 | 2005 |
| Chip-Level Statistical Leakage Modeling and Analysis XDT Sheldon, R Shen Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits, 120, 2011 | | 2011 |
| Statistical Performance Characterization and Analysis of Nano-Scale VLSI Circuits R Shen UC Riverside, 2011 | | 2011 |
| General Parameterized Thermal Modeling for Multi-core Microprocessor Design T Eguia, SXD Tan, R Shen, D Li, EH Pacheco, M Tirumala, L Wang | | |
