| Defect characterization and test generation for spintronic-based compute-in-memory SM Nair, C Münch, MB Tahoori 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 21 | 2020 |
| Spindrop: Dropout-based bayesian binary neural networks with spintronic implementation ST Ahmed, K Danouchi, C Münch, G Prenat, L Anghel, MB Tahoori IEEE Journal on Emerging and Selected Topics in Circuits and Systems 13 (1 …, 2023 | 18 | 2023 |
| Reliable in-memory neuromorphic computing using spintronics C Münch, R Bishnoi, MB Tahoori Proceedings of the 24th Asia and South Pacific design automation conference …, 2019 | 17 | 2019 |
| Special session–emerging memristor based memory and CIM architecture: Test, repair and yield analysis R Bishnoi, L Wu, M Fieback, C Münch, SM Nair, M Tahoori, Y Wang, H Li, ... 2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020 | 14 | 2020 |
| Tolerating retention failures in neuromorphic fabric based on emerging resistive memories C Münch, R Bishnoi, MB Tahoori 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 393-400, 2020 | 11 | 2020 |
| MBIST-supported trim adjustment to compensate thermal behavior of MRAM C Münch, J Yun, M Keim, MB Tahoori 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 10 | 2021 |
| Smart Hammering: A practical method of pinhole detection in MRAM memories SB Mamaghani, C Münch, J Yun, M Keim, MB Tahoori 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 9 | 2023 |
| Binary bayesian neural networks for efficient uncertainty estimation leveraging inherent stochasticity of spintronic devices S Tuhin Ahmed, K Danouchi, C Münch, G Prenat, A Lorena, M B. Tahoori Proceedings of the 17th ACM International Symposium on Nanoscale …, 2022 | 9 | 2022 |
| MBIST-based Trim-Search Test Time Reduction for STT-MRAM C Münch, J Yun, M Keim, MB Tahoori 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | 9 | 2022 |
| Defect characterization of spintronic-based neuromorphic circuits C Münch, MB Tahoori 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 8 | 2020 |
| Process and runtime variation robustness for spintronic-based neuromorphic fabric ST Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori 2022 IEEE European Test Symposium (ETS), 1-2, 2022 | 5 | 2022 |
| Special session: Stt-mrams: Technology, design and test A Gebregiorgis, L Wu, C Münch, S Rao, MB Tahoori, S Hamdioui 2022 IEEE 40th VLSI Test Symposium (VTS), 1-10, 2022 | 5 | 2022 |
| Testing resistive memory based neuromorphic architectures using reference trimming C Münch, MB Tahoori 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021 | 5 | 2021 |
| Multi-bit non-volatile spintronic flip-flop C Münch, R Bishnoi, MB Tahoori 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2018 | 5 | 2018 |
| Neuroscrub+: Mitigating retention faults using flexible approximate scrubbing in neuromorphic fabric based on resistive memories ST Ahmed, M Hefenbrock, C Münch, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 4 | 2022 |
| PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory M Fieback, C Münch, A Gebregiorgis, GC Medeiros, M Taouil, S Hamdioui, ... 2022 IEEE European Test Symposium (ETS), 1-6, 2022 | 4 | 2022 |
| Neuroscrub: Mitigating retention failures using approximate scrubbing in neuromorphic fabric based on resistive memories ST Ahmed, M Hefenbrock, C Münch, MB Tahoori 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 4 | 2021 |
| A Novel Oscillation-Based Reconfigurable In-Memory Computing Scheme With Error Correction C Münch, N Sayed, R Bishnoi, M Tahoori IEEE Transactions on Magnetics 57 (2), 1-10, 2020 | 4 | 2020 |
| A low overhead checksum technique for error correction in memristive crossbar for deep learning applications S Hemaram, ST Ahmed, M Mayahinia, C Münch, MB Tahoori 2023 IEEE 41st VLSI Test Symposium (VTS), 1-7, 2023 | 3 | 2023 |
| Analyzing and mitigating sensing failures in spintronic-based computing in memory M Mayahinia, C Münch, MB Tahoori 2021 IEEE International Test Conference (ITC), 268-277, 2021 | 3 | 2021 |
Mehdi B. TahooriProfessor of Computer Science, Karlsruhe Institute of Technology, GermanyVerified email at kit.edu
