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Prof. Govind P. AgrawalThe Institute of Optics, University of RochesterVerified email at optics.rochester.edu
Diego F GroszGrupo de Comunicaciones Ópticas, Depto. de Ing. en Telecomunicaciones, Centro Atómico BarilocheVerified email at ib.edu.ar
Anjali AgarwalCACIVerified email at caci.com
Yuzhe XiaoUniversity of North TexasVerified email at unt.edu
prashant bavejaquality and reliability of optical modulesVerified email at aeva.ai
Robert L McCroryuniversity of RochesterVerified email at lle.rochester.edu
Christophe DorrerUniversity of RochesterVerified email at lle.rochester.edu
Yoshiaki NakanoUniversity of TokyoVerified email at ee.t.u-tokyo.ac.jp
Juerg LeutholdInstitute of Electromagnetic Fields (IEF), ETH Zurich, Zurich, SwitzerlandVerified email at ethz.ch
Sethumadhavan ChandrasekharRetired Nokia Bell LabsVerified email at ieee.org
Amy RigattiUniversity of RochesterVerified email at lle.rochester.edu
Åsa HaglundChalmers University of TechnologyVerified email at chalmers.se
Johan GustavssonAssociated ProfessorVerified email at chalmers.se
Petter WestberghNvidiaVerified email at nvidia.com
Anders LarssonNVIDIAVerified email at nvidia.com
Saif Al GraitiPhD in Communications EngineeringVerified email at g.rit.edu
Xiang LiuHuawei TechnologiesVerified email at ieee.org
Stefan HunscheASML / Brion TechnologiesVerified email at asml.com
Douglas GillIBMVerified email at us.ibm.com
Greg RaybonDMTS, Nokia Bell LaboratoriesVerified email at nokia-bell-labs.com
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