On Testing of Superscalar Processors in Functional Mode for Delay Faults N Hage, R Gulve, M Fujita, V Singh VLSI Design and 2017 16th International Conference on Embedded Systems …, 2017 | 14 | 2017 |
Instruction-based self-test for delay faults maximizing operating temperature N Hage, R Gulve, M Fujita, V Singh On-Line Testing and Robust System Design (IOLTS), 2017 IEEE 23rd …, 2017 | 4 | 2017 |
On determination of instantaneous peak and cycle peak switching using ILP R Gulve, N Hage, J Tudu VLSI Design and Test (VDAT), 2016 20th International Symposium on, 1-6, 2016 | 4 | 2016 |
Achieving full functional coverage for the forwarding unit of pipelined processors VS Vineesh, N Hage, B Karthik, V Singh 2017 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2017 | | 2017 |