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Aurélien Moy
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Electron probe microanalysis: A review of recent developments and applications in materials science and engineering
X Llovet, A Moy, PT Pinard, JH Fournelle
Progress in Materials Science 116, 100673, 2021
692021
Measurements of absolute L-and M-subshell x-ray production cross sections of Pb by electron impact
A Moy, C Merlet, X Llovet, O Dugne
Journal of Physics B: Atomic, Molecular and Optical Physics 46 (11), 115202, 2013
402013
M-subshell ionization cross sections of U by electron impact
A Moy, C Merlet, X Llovet, O Dugne
Journal of Physics B: Atomic, Molecular and Optical Physics 47 (5), 055202, 2014
252014
Standardless quantification of heavy elements by electron probe microanalysis
A Moy, C Merlet, O Dugne
Analytical chemistry 87 (15), 7779-7786, 2015
142015
ϕ(ρz) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis Program
A Moy, J Fournelle
Microscopy and Microanalysis 27 (2), 284-296, 2021
132021
Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old Approach
A Moy, J Fournelle, A Von Der Handt
Microscopy and Microanalysis 25 (3), 664-674, 2019
132019
Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering
X Llovet, A Moy, PT Pinard, JH Fournelle
Progress in Materials Science 120, 100818, 2021
122021
ϕ(ρz) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified ϕ(ρz) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung …
A Moy, J Fournelle
Microscopy and Microanalysis 27 (2), 266-283, 2021
112021
Solving the iron quantification problem in low-kV EPMA: An essential step toward improved analytical spatial resolution in electron probe microanalysis—Olivines
A Moy, JH Fournelle, A Handt
American Mineralogist 104 (8), 1131-1142, 2019
102019
Measurements of absolute Mα x‐ray production cross sections of heavy elements Au, Pb, Bi, and U by electron impact
C Merlet, A Moy, X Llovet, O Dugne
Surface and Interface Analysis 46 (12-13), 1170-1173, 2014
92014
Badgerfilm: An open source thin film analysis program
A Moy, J Fournelle
Microscopy and Microanalysis 26 (S2), 496-498, 2020
82020
Analytical Spatial Resolution in EPMA: What is it and How can it be Estimated?
A Moy, J Fournelle
Microscopy and Microanalysis 23 (S1), 1098-1099, 2017
62017
Electron probe microanalysis of transition metals using L lines: The effect of self-absorption
X Llovet, A Moy, JH Fournelle
Microscopy and Microanalysis 28 (1), 123-137, 2022
52022
Measurements of absolute M-subshell X-ray production cross sections of Th by electron impact
A Moy, C Merlet, O Dugne
Chemical Physics 440, 18-24, 2014
52014
Proposal: Let's Develop a Community Consensus K-ratio Database
N Ritchie, D Newbury, E Bullock, P Carpenter, J Donovan, J Fournelle, ...
Microscopy and Microanalysis 26 (S2), 1774-1776, 2020
32020
Modern thin film analysis by electron probe microanalysis
A Moy, J Fournelle
2019 MAS Quantitative Microanalysis Topical Conference, 64-65, 2019
32019
Optimization of actinide quantification by electron probe microanalysis
A Moy, C Merlet, X Llovet, O Dugne
2013 3rd International Conference on Advancements in Nuclear Instrumentation …, 2013
32013
Optimization of actinide quantification by electron probe microanalysis
A Moy, C Merlet, X Llovet, O Dugne
2013 3rd International Conference on Advancements in Nuclear Instrumentation …, 2013
32013
Reconstructing diagenetic mineral reactions from silicified horizons of the Paleoproterozoic Biwabik Iron Formation, Minnesota
S Duncanson, L Brengman, J Johnson, A Eyster, J Fournelle, A Moy
American Mineralogist 109 (2), 339-358, 2024
22024
The EPMA Matrix Correction: All Elements Must Be Present for Accuracy: Four Examples with B, C, O and F
J Fournelle, A Moy, W Nachlas, J Donovan
Microscopy and Microanalysis 26 (S2), 58-59, 2020
22020
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