| Pattern-generation and pattern-transfer for single-digit nano devices IW Rangelow, A Ahmad, T Ivanov, M Kaestner, Y Krivoshapkina, ... Journal of Vacuum Science & Technology B 34 (6), 2016 | 47 | 2016 |
| Advanced electric-field scanning probe lithography on molecular resist using active cantilever M Kaestner, C Aydogan, T Ivanov, A Ahmad, T Angelov, A Reum, ... Journal of Micro/Nanolithography, MEMS, and MOEMS 14 (3), 031202-031202, 2015 | 46 | 2015 |
| Artificial intelligence for electricity supply chain automation L Richter, M Lehna, S Marchand, C Scholz, A Dreher, S Klaiber, S Lenk Renewable and Sustainable Energy Reviews 163, 112459, 2022 | 43 | 2022 |
| Scanning probes in nanostructure fabrication M Kaestner, T Ivanov, A Schuh, A Ahmad, T Angelov, Y Krivoshapkina, ... Journal of Vacuum Science & Technology B 32 (6), 2014 | 42 | 2014 |
| Large area fast-AFM scanning with active “Quattro” cantilever arrays A Ahmad, N Nikolov, T Angelov, T Ivanov, A Reum, I Atanasov, E Guliyev, ... Journal of Vacuum Science & Technology B 34 (6), 2016 | 37 | 2016 |
| Room-temperature single dopant atom quantum dot transistors in silicon, formed by field-emission scanning probe lithography Z Durrani, M Jones, F Abualnaja, C Wang, M Kaestner, S Lenk, C Lenk, ... Journal of Applied Physics 124 (14), 2018 | 36 | 2018 |
| Atomic force microscope integrated with a scanning electron microscope for correlative nanofabrication and microscopy IW Rangelow, M Kaestner, T Ivanov, A Ahmad, S Lenk, C Lenk, E Guliyev, ... Journal of Vacuum Science & Technology B 36 (6), 2018 | 30 | 2018 |
| Six-axis AFM in SEM with self-sensing and self-transduced cantilever for high speed analysis and nanolithography T Angelov, A Ahmad, E Guliyev, A Reum, I Atanasov, T Ivanov, V Ishchuk, ... Journal of Vacuum Science & Technology B 34 (6), 2016 | 25 | 2016 |
| Experimental study of field emission from ultrasharp silicon, diamond, GaN, and tungsten tips in close proximity to the counter electrode C Lenk, S Lenk, M Holz, E Guliyev, M Hofmann, T Ivanov, IW Rangelow, ... Journal of Vacuum Science & Technology B 36 (6), 2018 | 24 | 2018 |
| Electric field scanning probe lithography on molecular glass resists using self-actuating, self-sensing cantilever M Kaestner, K Nieradka, T Ivanov, S Lenk, Y Krivoshapkina, A Ahmad, ... Alternative Lithographic Technologies VI 9049, 55-63, 2014 | 23 | 2014 |
| Quantum approximate optimization algorithm for qudit systems Y Deller, S Schmitt, M Lewenstein, S Lenk, M Federer, F Jendrzejewski, ... Physical Review A 107 (6), 062410, 2023 | 20 | 2023 |
| Nanofabrication by field-emission scanning probe lithography and cryogenic plasma etching C Lenk, M Hofmann, S Lenk, M Kaestner, T Ivanov, Y Krivoshapkina, ... Microelectronic Engineering 192, 77-82, 2018 | 20 | 2018 |
| Quantum optimization: Potential, challenges, and the path forward A Abbas, A Ambainis, B Augustino, A Bärtschi, H Buhrman, C Coffrin, ... arXiv preprint arXiv:2312.02279, 2023 | 19 | 2023 |
| Field-emission scanning probe lithography tool for 150 mm wafer M Holz, E Guliyev, A Ahmad, T Ivanov, A Reum, M Hofmann, C Lenk, ... Journal of Vacuum Science & Technology B 36 (6), 2018 | 19 | 2018 |
| Low-energy electron exposure of ultrathin polymer films with scanning probe lithography Y Krivoshapkina, M Kaestner, C Lenk, S Lenk, IW Rangelow Microelectronic Engineering 177, 78-86, 2017 | 19 | 2017 |
| 2D simulation of Fowler-Nordheim electron emission in scanning probe lithography S Lenk, M Kaestner, C Lenk, T Angelov, Y Krivoshapkina, IW Rangelow J Nanomater Mol Nanotechnol 5 (6), 1000201, 2016 | 19 | 2016 |
| Field-emission scanning probe lithography with self-actuating and self-sensing cantilevers for devices with single digit nanometer dimensions IW Rangelow, C Lenk, M Hofmann, S Lenk, T Ivanov, A Ahmad, ... Novel Patterning Technologies 2018 10584, 13-25, 2018 | 14 | 2018 |
| Scanning probe-based high-accuracy overlay alignment concept for lithography applications V Ishchuk, E Guliyev, C Aydogan, I Buliev, M Kaestner, T Ivanov, A Ahmad, ... Applied Physics A 123, 1-12, 2017 | 13 | 2017 |
| Simulation of field emission from volcano-gated tips for scanning probe lithography S Lenk, M Kaestner, C Lenk, IW Rangelow Microelectronic Engineering 177, 19-24, 2017 | 12 | 2017 |
| Quantum optimization: Potential, challenges, and the path forward (2023) A Abbas, A Ambainis, B Augustino, A Bärtschi, H Buhrman, C Coffrin, ... arXiv preprint arXiv:2312.02279, 0 | 11 | |
