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- Stefano MaciDipartimento di Ingegneria dell'Informazione e Scienze Matematiche, University of SienaVerified email at dii.unisi.it
- Enrica MartiniUniversity of SienaVerified email at dii.unisi.it
- Nader EnghetaH. Nedwill Ramsey Professor, University of PennsylvaniaVerified email at seas.upenn.edu
- matteo albaniUniversity of SienaVerified email at unisi.it
- Yue LiAssociate Professor, Department of Electronic Engineering, Tsinghua University, Beijing, ChinaVerified email at seas.upenn.edu
- Xingchen YeIndiana University BloomingtonVerified email at indiana.edu
- Christopher B. MurrayProfessor of Chemistry and Materials Science and EngineeringVerified email at sas.upenn.edu
- Iñigo LiberalUniversidad Publica de NavarraVerified email at unavarra.es
- Valerio VignoliProfessore di Elettronica, Università di SienaVerified email at unisi.it
- Tommaso AddabboAssociate Professor, University of SienaVerified email at dii.unisi.it
- Marco MugnainiAssociate Professor University of SienaVerified email at dii.unisi.it
- Giuseppe VecchiPolitecnico di TorinoVerified email at polito.it
- Raj MittraProfessor, Penn State UniversityVerified email at ieee.org
- Massimiliano CasalettiAssociate Professor - Sorbonne Universités UPMC, ParisVerified email at upmc.fr
- Filippo CapolinoUniversity of California, IrvineVerified email at uci.edu
- Alessandro GarufoTNO Defense Security and SafetyVerified email at tno.nl
- Mário SilveirinhaProfessor of Electrical Engineering, University of Lisbon, PortugalVerified email at tecnico.ulisboa.pt
- Danilo ErricoloProfessor, University of Illinois Chicago; Chair, IEEE AP-S Meetings CommitteeVerified email at uic.edu
- Artur DavoyanUniversity of California, Los AngelesVerified email at seas.ucla.edu