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Co-authors
- Guodong LiuR&D Staff, Oak Ridge National LaboratoryVerified email at ornl.gov
- Xiaohu ZhangPh.D in EECSVerified email at vols.utk.edu
- Seddik DjouadiVerified email at utk.edu
- Anjan BoseProfessor of EECS, Washington State UniversityVerified email at wsu.edu
- Aleksandar DimitrovskiUniversity of Central FloridaVerified email at ucf.edu
- Fangxing (Fran) LiJohn W. Fisher Professor at Univ. of Tennessee, IEEE Fellow, Director of CURENT, EIC of IEEE OAJPEVerified email at utk.edu
- Yichen ZhangUniversity of Texas at ArlingtonVerified email at uta.edu
- Ben OllisR&D Staff, Oak Ridge National LaboratoryVerified email at ornl.gov
- Leon M. TolbertChancellor's Professor in Electrical Engineering, The University of TennesseeVerified email at utk.edu
- Yaming Zhu, Ph.D, P.E.Siemens PTIVerified email at siemens.com
- Yiwei MaEPRIVerified email at epri.com
- Bailu XiaoR&D Staff, Oak Ridge National LaboratoryVerified email at ornl.gov
- Ailin AsadinejadPhD student at The University of TennesseeVerified email at utk.edu
- Chen-Ching LiuVirginia TechVerified email at vt.edu
- Ehsan RaoufatBloom EnergyVerified email at vols.utk.edu
- Liu YangPh.D Student of Electrical Engineering, The University of TennesseeVerified email at utk.edu
- Mohammed OlamaResearch Staff, Oak Ridge National LaboratoryVerified email at ornl.gov
- Hantao CuiAssociate Professor at North Carolina State UniversityVerified email at ncsu.edu
- Oguzhan CeylanKadir Has UniversityVerified email at khas.edu.tr
- Siqi WangAssociate ProfessorVerified email at seu.edu.cn