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Jean-Michel Geffrin
Jean-Michel Geffrin
Verified email at fresnel.fr
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Cited by
Year
Magnetic and electric coherence in forward-and back-scattered electromagnetic waves by a single dielectric subwavelength sphere
JM Geffrin, B García-Cámara, R Gómez-Medina, P Albella, ...
Nature communications 3 (1), 1171, 2012
6392012
Free space experimental scattering database continuation: Experimental set-up and measurement precision
JM Geffrin, P Sabouroux, C Eyraud
inverse Problems 21 (6), S117, 2005
3472005
Full-wave three-dimensional microwave imaging with a regularized Gauss–Newton method—Theory and experiment
J De Zaeytijd, A Franchois, C Eyraud, JM Geffrin
IEEE Transactions on Antennas and Propagation 55 (11), 3279-3292, 2007
1942007
Continuing with the Fresnel database: experimental setup and improvements in 3D scattering measurements
JM Geffrin, P Sabouroux
Inverse Problems 25 (2), 024001, 2009
1462009
Small dielectric spheres with high refractive index as new multifunctional elements for optical devices
MI Tribelsky, JM Geffrin, A Litman, C Eyraud, F Moreno
Scientific reports 5 (1), 12288, 2015
992015
High‐Q transparency band in all‐dielectric metasurfaces induced by a quasi bound state in the continuum
DR Abujetas, Á Barreda, F Moreno, A Litman, JM Geffrin, JA Sánchez‐Gil
Laser & Photonics Reviews 15 (1), 2000263, 2021
942021
Controllable emission of a dipolar source coupled with a magneto-dielectric resonant subwavelength scatterer
B Rolly, JM Geffrin, R Abdeddaim, B Stout, N Bonod
Scientific reports 3 (1), 3063, 2013
752013
Drift correction for scattering measurements
C Eyraud, JM Geffrin, A Litman, P Sabouroux, H Giovannini
Applied physics letters 89 (24), 2006
672006
Validation of a 3D bistatic microwave scattering measurement setup
C Eyraud, JM Geffrin, P Sabouroux, PC Chaumet, H Tortel, H Giovannini, ...
Radio Science 43 (04), 1-12, 2008
542008
Optimization of a bistatic microwave scattering measurement setup: From high to low scattering targets
JM Geffrin, C Eyraud, A Litman, P Sabouroux
Radio Science 44 (02), 1-12, 2009
502009
Electromagnetic polarization-controlled perfect switching effect with high-refractive-index dimers and the beam-splitter configuration
AI Barreda, H Saleh, A Litman, F González, JM Geffrin, F Moreno
Nature communications 8 (1), 13910, 2017
422017
Molding acoustic, electromagnetic and water waves with a single cloak
J Xu, X Jiang, N Fang, E Georget, R Abdeddaim, JM Geffrin, M Farhat, ...
Scientific reports 5 (1), 10678, 2015
422015
Microwave imaging techniques for biomedical applications
A Joisel, J Mallorqui, A Broquetas, JM Geffrin, N Joachimowicz, ...
IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement …, 1999
411999
Aperture antenna modeling by a finite number of elemental dipoles from spherical field measurements
M Serhir, JM Geffrin, A Litman, P Besnier
IEEE transactions on antennas and propagation 58 (4), 1260-1268, 2010
402010
Brewster quasi bound states in the continuum in all-dielectric metasurfaces from single magnetic-dipole resonance meta-atoms
DR Abujetas, Á Barreda, F Moreno, JJ Sáenz, A Litman, JM Geffrin, ...
Scientific Reports 9 (1), 16048, 2019
362019
Complex permittivity determination from far-field scattering patterns
C Eyraud, JM Geffrin, A Litman, H Tortel
IEEE Antennas and Wireless Propagation Letters 14, 309-312, 2014
362014
A new value picking regularization strategy—Application to the 3-D electromagnetic inverse scattering problem
J De Zaeytijd, A Franchois, JM Geffrin
IEEE transactions on antennas and propagation 57 (4), 1133-1149, 2009
352009
Recent advances in microwave analog to light scattering experiments
R Vaillon, JM Geffrin
Journal of Quantitative Spectroscopy and Radiative Transfer 146, 100-105, 2014
342014
A new implementation of a microwave analog to light scattering measurement device
R Vaillon, JM Geffrin, C Eyraud, O Merchiers, P Sabouroux, B Lacroix
Journal of Quantitative Spectroscopy and Radiative Transfer 112 (11), 1753-1760, 2011
342011
Microwave measurements of the full amplitude scattering matrix of a complex aggregate: a database for the assessment of light scattering codes
O Merchiers, C Eyraud, JM Geffrin, R Vaillon, B Stout, P Sabouroux, ...
Optics Express 18 (3), 2056-2075, 2010
342010
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