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Co-authors
- Cham Wai KuenThe Chinese University of Hong KongVerified email at ee.cuhk.edu.hk
- Yibo ChenThe Chinese University of Hong KongVerified email at ee.cuhk.edu.hk
- Xingyu ZengSenseTimeVerified email at sensetime.com
- Shuai YiSenseTime Group LimitedVerified email at sensetime.com
- Xiaogang WangProfessor of Electronic Engineering, the Chinese University of Hong KongVerified email at ee.cuhk.edu.hk
- Hongliang RenChinese University of Hong Kong | National University of Singapore | JHU/Harvard(RF) | CUHK(PhD)Verified email at jhu.edu
- Max Q.-H. MengSouthern University of Science and TechnologyVerified email at ieee.org